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Double slit interferometry to measure the EUV refractive indices of solids using high harmonics

Author(s) : Wilson L.A.; AK Rossall, E Wagenaars, CM Cacho, E Springate, ICE Turcu, and GJ Tallents

Reference (journal/conference name, volume, issue, pages) : Applied Optics 51 2057

Year : 2012

Type : publication

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