Double slit interferometry to measure the EUV refractive indices of solids using high harmonics
Author(s) : Wilson L.A.; AK Rossall, E Wagenaars, CM Cacho, E Springate, ICE Turcu, and GJ Tallents
Reference (journal/conference name, volume, issue, pages) : Applied Optics 51 2057
Year : 2012
Type : publication
Document :
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